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Virtual DLTS User Meeting 2023

DLTS Virtual User Meeting

Deep-level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate semiconductor defects' concentration and carrier binding energy by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various DLTS modes for highly demanding applications, Zurich Instruments wishes to bring together the community of users facing distinct measurement challenges while sharing core competencies and know-how. We are happy to announce the 3rd edition of this user meeting to be held virtually on December 6th, 2023.

Register now for the User Meeting

The 3rd DLTS User Meeting will focus on:

  • Empowering researchers by sharing best practices, tips and tricks in the form of detailed tutorials to create a community of super-users;
  • Celebrating our customers' achievements with high-level scientific talks;
  • Fostering interactions, exchanging ideas and networking via open Q&A sessions.

Invited Speakers

Dr. Piotr Kruszewski

Dr. Teimuraz Mchedlidze

Piotr Kruszewski

Dr. Piotr Kruszewski is an assistant professor at the Institute of High-Pressure Physics of the Polish Academy of Sciences. He received a PhD degree in solid-state physics from the Institute of Physics, Polish Academy of Sciences. Piotr spent two years as a postdoc at the Institut Matériaux Microélectronique Nanosciences de Provence. He has authored over 50 papers and launched numerous collaborations with national and foreign laboratories and institutes. He can be reached at:

Teimuraz Mchedlidze

Dr. Teimuraz Mchedlidze has more than 30 years of experience in research of semiconductor materials: fabrication, characterization, and development of related technologies. He has a wide range of scientific interests, emphasizing the investigation, engineering, and employment of various defects and nanostructures in semiconductors. Tei is passionate about improving existing material characterization methods and inventing new ones. He can be reached at:


Wednesday, December 6th, 2023, 14:00 to 17:30 CET

Time (CET)Session
14:00 - 14:10
Opening Remarks

Gustavo Ciardi – Application Scientist, Zurich Instruments AG 

14:10 - 14:50
Invited Talk

Dr. Piotr Kruszewski – Institute of High-Pressure Physics of the Polish Academy of Sciences, Warsaw

Deep traps in GaN-based materials studied by DLTS-related techniques

14:50 -15:30
Zurich Instruments Tutorial 1

Ronald Alexander –  Application Scientist, Zurich Instruments AG

Capturing DLTS Capacitance Transients with the MFIA

15:30 - 16:00Virtual Coffee Break and networking session
16:00 - 16:30
Invited Talk

Dr. Teimuraz Mchedlidze – Institute for Applied Physics, Technical University Bergakademie, Freiberg

Pros for using MFIA in deep-level transient spectroscopy studies 

16:30 - 17:10
Zurich Instruments Tutorial 2

Sandhya Tammireddy – Application Scientist, Zurich Instruments AG

Defect spectroscopy with the MFIA

17:10 -17:30
Closing Remarks
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