Deep-level transient spectroscopy (DLTS) is a powerful and commonly used technique to investigate semiconductor defects' concentration and carrier binding energy by measuring capacitance transients at different temperatures. As such, it is a critical tool for the characterization of all forms of semiconductors. As an enabler of various DLTS modes for highly demanding applications, Zurich Instruments wishes to bring together the community of users facing distinct measurement challenges while sharing core competencies and know-how. We are happy to announce the 3rd edition of this user meeting to be held virtually on December 6th, 2023.
Virtual DLTS User Meeting 2023
The 3rd DLTS User Meeting will focus on:
- Empowering researchers by sharing best practices, tips and tricks in the form of detailed tutorials to create a community of super-users;
- Celebrating our customers' achievements with high-level scientific talks;
- Fostering interactions, exchanging ideas and networking via open Q&A sessions.
Invited Speakers
Program
Wednesday, December 6th, 2023, 14:00 to 17:30 CET
Time (CET) | Session |
14:00 - 14:10 | Opening Remarks Gustavo Ciardi – Application Scientist, Zurich Instruments AG |
14:10 - 14:50 | Invited Talk Dr. Piotr Kruszewski – Institute of High-Pressure Physics of the Polish Academy of Sciences, Warsaw Deep traps in GaN-based materials studied by DLTS-related techniques |
14:50 -15:30 | Zurich Instruments Tutorial 1 Ronald Alexander – Application Scientist, Zurich Instruments AG Capturing DLTS Capacitance Transients with the MFIA |
15:30 - 16:00 | Virtual Coffee Break and networking session |
16:00 - 16:30 | Invited Talk Dr. Teimuraz Mchedlidze – Institute for Applied Physics, Technical University Bergakademie, Freiberg Pros for using MFIA in deep-level transient spectroscopy studies |
16:30 - 17:10 | Zurich Instruments Tutorial 2 Sandhya Tammireddy – Application Scientist, Zurich Instruments AG Defect spectroscopy with the MFIA |
17:10 -17:30 | Closing Remarks |