Scanning probe microscopy (SPM) takes on different forms depending on the operating environment (ambient, liquid or vacuum), the type of measurement force under investigation (short-range or long-range), and the actuation scheme (mechanical, electrical, magnetic, or optical). SPM is a well-established high-resolution imaging tool. It features frequently in interdisciplinary projects in the fields of nanotechnology and nano-optics, and can be used to address and manipulate nano-objects such as single atoms, single molecules and quantum dots.
Zurich Instruments focuses on instrumentation challenges in SPM, in particular on those related to new modes of operation, new sensors, or fast real-time data acquisition and feedback loops. With instruments covering frequencies from DC to 600 MHz, Zurich Instruments helps SPM specialists to perform time- and frequency-domain data analysis to capture and control complex tip-sample interactions.